Providing comprehensive testing solutions for power semiconductor devices (IGBT, SiC, GaN), from R&D to application-end.

Providing end-to-end, high-volume manufacturing screening test solutions for power semiconductors across Device, DBC, Die, and Wafer levels.

Delivering solutions for SiC device dynamic bias reliability testing in compliance with AQG 324 standard.

Providing fully automated SiC wafer-level burn-in (WLBI) testing solutions for both 6-inch and 8-inch wafers.