The ME400D is an equipment for IGBT/SiC power modules, used for R&D and application dynamic characteristic test. The equipment can help manufacturers to test modules, quickly generate specifications and test reports. At the same time, the equipment can help module applications to evaluate electric drives or inverters, gate parameter self matching and incoming material inspection. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

ME400D-SE is an equipment for IGBT/SiC MOSFET power semiconductor discrete, used for R&D and application dynamic characteristic test.The equipment can help manufacturers to research devices,quickly generate specifications and test reports. And at the same time, the equipment can help power semiconductor devices applications to evaluate electric drives or inverters, gate parameter self-matching and incoming material inspection. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

The ME100DHTXB is designed for dynamic bias reliability tests of SiC devices and modules. The equipment can help SiC products manufacturers perform DHTGB，DHTRB reliability tests. This equipment also assists third-party testing laboratories in conducting reliability certification tests according to AQG 324, AEC-Q101, JEDEC JEP184 and other standards. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

The ME200DHTXB is a newly upgraded version of the ME100DHTXB, designed for dynamic bias reliability testing of SiC devices in mass production. This equipment assists SiC device manufacturers in conducting DGS and DRB mass production screening tests and can be integrated with automation systems to provide a one-stop solution for high-volume final testing. It also supports semi-automated loading and unloading, making it suitable for various small-batch final testing and incoming inspection applica ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

The ME100DS-PIM offers a comprehensive and professional automatic test solution for manufacturers. It is designed for the mass production of IGBT, SiC modules, DBC and supports both dynamic and static testing. Two-station parallel testing is avaliable. The UIS, RgCg, insulation and other test items are configurable based on requirements. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

The ME100D-AM is a dynamic parameter testing system designed for the mass production of IGBT/SiC devices. It assists power device manufacturers in performing static parameter testing during production, providing not only automated testing solutions but also a turntable for manual loading and unloading. It supports both automated and manual testing, offering customers more options. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

To address the testing needs of 3-level devices and overcome the challenges associated with testing them, Firstack has introduced the ME100D-AM-3L, a dynamic test system specifically designed for 3-level power devices. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

The ME100S-AM is a static parameter testing system designed for the mass production of IGBT/SiC devices. It assists power device manufacturers in performing static parameter testing during production, providing not only automated testing solutions but also a turntable formanual loading and unloading. It supports both automated and manual testing, offering customers more options. ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。

ME200WLR provides a fully automated SiC wafer-level burn-in testing solution.

The system supports 6-inch and 8-inch SiC MOSFET wafers and enables HTGB (High Temperature Gate Bias) and HTRB (High Temperature Reverse Bias) testing. It accurately measures key parameters including VGS(th), IGSS, and IDSS, allowing early failure screening at the wafer level.

The system features independent control for each drawer, enabling parallel burn-in of multiple wafers under different test conditions. Test re ME400D是一款针对IGBT/SiC MOSFET功率模块研发及应用端动态特性测试评估的设备，同时可以帮助功率模块应用厂家进行变流器测试评估，门极参数优化，器件二供导入等。