The ME100D-AM is a dynamic parameter testing system designed for the mass production of IGBT/SiC devices. It assists power device manufacturers in performing static parameter testing during production, providing not only automated testing solutions but also a turntable for manual loading and unloading. It supports both automated and manual testing, offering customers more options.

• 6 Channels SiC Drivers
  Self-developed ASIC drivers with dead-timeout put, cross talk suppression, and Miller clamping functions. 
  The resistor switching and Q_g/Q_gs/Q_gd testing are supported.

   

• Rapid Short-circuit Protection for High Current
  Programmable short-circuit protection with a maximum protection current of 15,000 A and response time of <1.5 μs.

   

• Low Parasitic Inductance

  Parasitic inductance (device and fixture not included)< 15 nH.

• Flexible Configuration

  Supports testing of both two-level and three-level topology modules. 
  Supports contact resistance, Vth, single/double pulse, multi-pulse, and complementary pulse testing.