The ME100DS-PIM offers a comprehensive and professional automatic test solution for manufacturers. It is designed for the mass production of IGBT, SiC modules, DBC and supports both dynamic and static testing. Two-station parallel testing is avaliable. The UIS, R_gC_g, insulation and other test items are configurable based on requirements.

• Supports Both Dynamic and Static Testing for IGBT, SiC MOSFET and DBC
  The equipment provides maximum output of "1200 V, 4000 A, 12000 A (SC)" for dynaminc testing and 
  “2000 V, 2000 A" for static testing.

   

• Integrated Dynamic&Static Testing, Two-station in Parallel, High UPH
  Supports two-station testing in parallel, enabling a high UPH of 400 (based on six-pack module).

   

• Proprietary Short-circuit Protection for Extended Measurement Range

  Built-in proprietary short-circuit protection with protection current of 12,000 A and response time of 1.5 μs. 
  Optimized loop design minimizes parasitic inductance to as low as 15 nH.

• Compatible with Various Handlers and Probe Stations, Offering Customized One-stop ATE Solutions

  One platform covers testing of Modules, DBCs, Dies, and Wafers, offering users more testing options. 
  Supports "HardDocking" to enhance the automation lev el of mass production testing on the production line.