The ME100S-AM is a static parameter testing system designed for the mass production of IGBT/SiC devices. It assists power device manufacturers in performing static parameter testing during production, providing not only automated testing solutions but also a turntable formanual loading and unloading. It supports both automated and manual testing, offering customers more options.

• ATE Architecture
  Integrated with AccoTEST resource boards and Firstack test units, ensuring stability, efficiency, and high accuracy.

   

• High-accuracy Pulsed High Current Source
  ± 3000A /30V / 1ms pulse current output capability, with current value measurement function. 
  Supports GFS testing，VGE range: 0 ~ 20 V.

   

• High-voltage Leakage Current Testing Capability

  Single channel: 1800 V, 20 mA for single channel.
  Two channels in series/parallel: up to 3600 V, 20 mA/1800 V, 40 mA.

• Flexible Configuration

  Supports contact resistance testing, short-circuit, open-circuit, and missing-pindetection. 
  Optional ZMU module supports R_g, C_iss, C_oss, C_rss testing.