The ME100DHTXB is designed for dynamic bias reliability tests of SiC devices and modules. The equipment can help SiC products manufacturers perform DHTGB，DHTRB reliability tests. This equipment also assists third-party testing laboratories in conducting reliability certification tests according to AQG 324, AEC-Q101, JEDEC JEP184 and other standards.

• Fast Turn-On&Turn-Off Technology
  Perfect match between high dV/dt and low overshoot.
  DGS: dV_GS/dt > 1 V/ns, no overshoot.
  DRB: dV_DS/dt > 50 V/ns, overshoot <15%.

   

• dV/dt Thread-Controlled Adjustment Technology
  Parameters like V_DC , I_C , T_Vj ,  V_GE , R_GON , R_GOFF , C_GE  can be automatic adjusted, quickly fit the output characteristic curve of power modules, and identify gate parameters suitable for power stacks.

   

• Accurate Parameter Measurement Technology

  Each workstation is equipped with customized test circuits.
  Real-time, accurate monitoring of parameters such as V_GS(th), I_GSS, I_DSS, and others.

   

• Customized Test Combinations

  The system features a cabinet, slot, and fixture free combination mode. 
  Each cabinet can be configured with DGS or DRB test functions.