The ME200DHTXB is a newly upgraded version of the ME100DHTXB, designed for dynamic bias reliability testing of SiC devices in mass production. This equipment assists SiC device manufacturers in conducting DGS and DRB mass production screening tests and can be integrated with automation systems to provide a one-stop solution for high-volume final testing. It also supports semi-automated loading and unloading, making it suitable for various small-batch final testing and incoming inspection applications.

• Mass Production Architecture

  Supports automated loading/unloading

   

• Modular Fixtur

  Supports fast changeover

   

• Multi-Level Turn-on/Turn off Technology

  Ensures controllable overshoot under high dV/dt conditions

   

• Online Programmable dV/dt Adjustment

  Quickly adapts to dV/dt requirements of different devices