ME400D-SE is an equipment for IGBT/SiC MOSFET power semiconductor discrete, used for R&D and application dynamic characteristic test.The equipment can help manufacturers to research devices,quickly   generate specifications  and  test  reports. And at the same time, the equipment can help power semiconductor devices applications to evaluate electric drives or inverters, gate parameter self-matching and incoming material inspection.

• Full-range Dynamic Characteristic Parameter Testing

  Testing items for the switching characteristics, reverse recovery characteristics, RBSOA, SCSOA, UIS, Q_g, R_DS(on) etc. of Si, SiC, GaN devices.

   

• The Industry's First Proposed High-Low Temperature Testing Solution

  Integrating a high and low temperature system enables the dynamic characteristic tests of discrete components within a temperature range of 40 - 200℃. The system provides protection at high temperatures and avoids condensation at low temperatures

   

• Gate Parameter Self-matching System

  Parameters like V_DC, I_C, T_Vj ,V_GE, R_GON, R_GOFF, C_GE ,can be automatic adjusted, quickly fit the output characteristic curve of power devices, and match the gate parameters of the power system.

   

• DpowerTest Software

  Supports double pulse testing and other testing items. Supports custom test procedures, report generation, waveform operation on the software interface, and installation and operation on a personal computer.

   

• Convenient Operation Platform

  The size of the operation platform is 900*640*670mm. It enables the rapid insertion and removal of fixtures, as well as the quick establishment of high and low temperature environments, thereby increasing the operational efficiency by more than double.